Scanning Electron Microscopy
Includes preparation of bulk samples and study of surface structure by secondary electron microscopy.
Equipment includes:
- LEO/Zeiss DSM 982 digital field emission scanning electron microscope
-
Polaron E3000 critical point drier
- Polaron E5100 sputter coater
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| LEO/Zeiss DSM 982 digital field emission SEM |
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University of Connecticut |